Study of GaAs epitaxial growth on Si substrates modified by focused ion beams

نویسندگان

چکیده

In this paper, we present a study of the effect silicon substrate modification by focused ion beams on subsequent growth GaAs layers molecular beam epitaxy. We demonstrate that when samples exposed to irradiation at various accelerating voltages and passes are annealed in absence arsenic flux, an increase depth modified Si areas occurs. At same time, crystallization gallium accumulations during annealing flux leads filling holes formed bombardment. reveal substrates with voltage 30 kV subjected temperature 600 o C is accompanied formation nanowires, density which increases within large number passes. The results conducted research can be used for development technological approaches epitaxial substrates. Keywords: epitaxy, monolithic integration, arsenide, silicon, beams.

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ژورنال

عنوان ژورنال: Fizika tverdogo tela

سال: 2022

ISSN: ['0367-3294', '1726-7498']

DOI: https://doi.org/10.21883/pss.2022.06.54368.278